PerkinElmer - 5300DV
Manufactured by PerkinElmer
Perkin Elmer, Inc. - Model 5300DV Inductively Coupled Plasma Spectrometer System
Perkin Elmer, Inc. - Model 5300DV Inductively Coupled Plasma Spectrometer System
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Features of 5300DV
- Building on the success of the Optima™, the world's most
- Enhanced real-time graphics and FIAS control allows transient measurements
- The SCD detector provides fast and accurate performance
- Exclusive high-resolution mode provides easier method development and greater accuracy
- Exceptional reliability with a second-generation integrated solid-state RF generator
- Dual-view optical system ensures the widest working range
- Thermostatted optical system eliminates peak profiling and searching, ensuring exceptional long-term stability
- Enhanced sample throughput and performance with simultaneous background correction
- Superior optics, excellent RF stability, and an optional thermostatted sample compartment make it easy to meet U.S. E.P.A. and DIN regulations
- A full line of sampling accessories
General Specifications
ICP Detection Method | Mass Spec. |