This product is Discontinued

Shimadzu - EDX Series

Manufactured by  Shimadzu
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X-ray Instruments

A non-destructive technique requiring no sample preparation, Energy Dispersive X-ray Fluorescence (EDX) spectrometry can be used either for compliance with various regulations (e.g. RoHS and ELV) and/or for quantitative analysis and monitoring processes in such application areas as chemicals, electronics, petrochemicals, metals, environmental, and foods.  
  
Equipped with new, specialized filters, and enabling analysis at parts-per-million (ppm) levels without pretreatment, the bench-top EDX series enables both trace and rapid analysis that goes beyond the limits of screening analysis.  
  
The three models in the EDX Series share a common chamber and software platform, with the EDX-720 as the base model. The EDX-800 has been upgraded to include an ultra thin polymer window detector to allow increased detection of low atomic number elements; elements from C to U are detectable.
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Features of EDX Series

Large Sample Compartment   Equipped with an automatic opening/closing door, the chamber can accommodate samples up to 300 mm wide and 150 mm high. This allows samples to be measured without breaking them into pieces.  

Combine with the optional sample turrets for fully automatic measurement at the touch of a button.  

Specialized Filters   The EDX is equipped with five types of filters that greatly improve detection sensitivity that reduce and eliminate:   –Background   --Characteristic lines   --Other forms of scattered radiation  

As a whole, the filters improve the detection sensitivity of lead, mercury, cadmium, and other elements.  

High-Count-Rate Circuit   The adoption of a modified counting system significantly reduces your overall analysis time. The circuit provides a count rate more than twice that of previous models, reducing analysis time by attaining the same level of precision and sensitivity in half the time required previously.  

CCD Camera   Install a CCD camera to allow accurate and repeatable measurements in one spot. Position to a specific position for measurement of:   –Foreign matter or samples made up of multiple parts   --Chemical analysis of mechanical and electrical small parts   --Particle analysis in food, plastics

General Specifications
Depth 650 mm
Height420 mm
Width 580 mm
Weight85 kg
Additional Specifications

Analytical method: X-ray spectrometer  
Method of measurement: Energy dispersive X-ray analysis  
Acceptable sample type: Solid, liquid or powder  
Element range: 11Na to 92U  
X-ray generator:   
X-ray tube: Rh target  
Tube voltage: 5-50kV  
Tube current: 1-1000µA  
Cooling method: Air cooling  
Primary filters: Automatic switching between 5 types  
Collimator size: Automatic exchange among 1, 3, 5 and 10mm diameter*  
Detector:   
Type: Si(Li) solid state detector  
Cooling method: LN2 cooling  
Sample Chamber:   
Atmosphere: Air, vacuum*, helium*  
Sample exchange*: 8 or 16-sample turrets, precision stage  
Sample observation*: CCD camera  
  
Installation Requirements:   
Temperature: 10-30°C  
Relative humidity: 40-70%

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