ZEISS - LIBRA® 200 Cs-TEM and LIBRA® 200 Cs-STEM
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Corrected View of the Sub-Ångstrom World
Combining the well established LIBRA® 200 platform with state-of-the-art aberration correctors provides powerful new atomic-scale imaging and analytical capabilities.
Dramatically improved resolution and chemical sensitivity now give access to developing next-generation applications in fields such as materials science, soft matter, life sciences, semiconductor and nanotechnology.
Both instruments may be equipped with a dispersionfree electrostatic monochromator providing an energy resolution < 0.15 eV and a further improvement of the information limit of the instrument.
Dramatically improved resolution and chemical sensitivity now give access to developing next-generation applications in fields such as materials science, soft matter, life sciences, semiconductor and nanotechnology.
Both instruments may be equipped with a dispersionfree electrostatic monochromator providing an energy resolution < 0.15 eV and a further improvement of the information limit of the instrument.
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Features of LIBRA® 200 Cs-TEM and LIBRA® 200 Cs-STEM
The LIBRA® 200 Cs-TEM improves the point resolution of the microscope up to its information limit by incorporating an imaging corrector for the objective lens:
- Point resolution < 80pm @ 200 kV
- Operation between 80 kV and 200 kV
- Atomic resolution at 80 kV
- Delocalisation free imaging
The LIBRA® 200 Cs-STEM, with an aberration corrector for the illumination system enables sub-Ångstrom resolution in STEM mode:
- STEM resolution < 0.1 nm @ 200 kV
- Probe current ten times higher than the standard (uncorrected) system, leading to improved signal-to-noise and significantly enhanced chemical sensitivity
- Superior energy resolution without sacrificing probe size (resolution), by combining with a monochromator
General Specifications
| Electron Microscope Type | TEM |
| Microscope Type | Electron |