ZEISS - LIBRA®120 PLUS
Manufactured by ZEISS
Versatile Analytical TEM Workhorse
To match the increased demands in revealing structural and 3-D information of beam sensitive or frozen hydrated samples at a nano scale the LIBRA®120 PLUS now offers a completely redesigned vacuum system setting new benchmarks. Upgrade paths together with a highly flexible detector concept make this energy filtering TEM an extremely versatile tool for a broad range of applications requiring ease of use and high specimen throughput.
The integrated Koehler Illumination System guarantees minimum beam damage, reproducible illumination conditions, permanently homogeneous and strictly parallel beam with exactly quantifiable dose rates.
Invented by ZEISS, this concept is recognized as state of the art for light and electron microscopes.
The life-time factory aligned in-column OMEGA energy filter improves image contrast by completely eliminating
chromatic aberrations. It provides a seamless integration and extends the LIBRA®120 PLUS to a fully analytical TEM enabling STEM, EDS, ESI and EELS.
Whatever information is in your sample, the LIBRA®120 PLUS will make it visible.
The integrated Koehler Illumination System guarantees minimum beam damage, reproducible illumination conditions, permanently homogeneous and strictly parallel beam with exactly quantifiable dose rates.
Invented by ZEISS, this concept is recognized as state of the art for light and electron microscopes.
The life-time factory aligned in-column OMEGA energy filter improves image contrast by completely eliminating
chromatic aberrations. It provides a seamless integration and extends the LIBRA®120 PLUS to a fully analytical TEM enabling STEM, EDS, ESI and EELS.
Whatever information is in your sample, the LIBRA®120 PLUS will make it visible.
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Features of LIBRA®120 PLUS
- In-column OMEGA energy filter
- Koehler Illumination System
- Patented Automatic Illumination System (AIS) for maximum flexibility
- Open detector strategy
- Completely dry vacuum system (TMP based)
- Flexible upgrade path for detectors and vacuum system
General Specifications
Magnification | 8 to 630000 x |
Accelerating voltage | 40 to 120 kV |
Electron Microscope Type | TEM |
Microscope Type | Electron |
Additional Specifications
Resolution
Point - Point: 0.34nm
Information Limit: <0.20nm
STEM: <1.50nm
Magnification
STEM: 50 - 1,000,000 x
EELS: 20 - 315 x
Spectrometer
Lifetime factory aligned In-column OMEGA type
Dispersion: 1.17µm/eV @ 120kV
Energy resolution: <1.5eV
Distortion: <±1.0%
Acceptance angle: 80 mrad at DE = ±6eV
Isochromaticity: <1.0 eV in 2.5 cm at final image plane
Illumination System: Highly flexible advanced Koehler illumination system