ZEISS - EVO® MA 25
Super large SEM - just got larger
With a taller chamber able to handle specimens more that 200 mm tall, with larger movements on the motorised 5 axis stage, the EVO® MA 25 offers a perfect imaging solution for large specimens. Application fields are forensics, museums, car manufacturing, aerospace, flat panel displays and printed circuit boards.
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Features of EVO® MA 25
Maximum specimen height of 210 mm
Maximum specimen weight of 5 kg
Maximum specimen diameter of 300 mm
Variable pressure operation
High brightness LaB6 source option
BeamSleeve® option for
New features
Motorised Z movement of 50 mm, X and Y both 130 mm.
Navigation by imported images from other digital sources
Improved LaB6 imaging for x-ray analysis
Support for two chamberscopes
General Specifications
| Magnification | 5 to 1000000 x |
| Accelerating voltage | 0.2 to 30 kV |
| Electron Microscope Type | SEM |
| Power Requirements | 100 - 240 V, 50 or 60 Hz single phase, no water cooling requirement |
| Field of View | 6mm at the Analytical Working Distance (AWD) |
| Microscope Type | Electron |
Additional Specifications
X-ray Analysis:
8.5mm AWD and 35° take-off angle
OptiBeam®* Modes:
Resolution, Depth, Analysis, Field, Fisheye
Pressure Range:
10 - 400 Pa (MA Series)
10 - 3000 Pa (LS Series)
Available Detectors:
BSD – Multisegment Diode
ETSE – Everhart-Thornley Secondary Electron Detector
VPSE – Variable Pressure Secondary Electron Detector
SCD – Specimen Current Detector
Chamber:
420mm (Ø) x 330mm (h)
Maximum Specimen Height:
210 mm
Image Framestore:
3072 x2304 pixel, signal acquisition by integrating and averaging