FEI Company - Quanta™ Series
Quanta™ Scanning Electron Microscope
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Features of Quanta™ Series
The Quanta line of scanning electron microscopes are versatile, high-performance instruments with three modes (high vacuum, low vacuum and ESEM) to accommodate the widest range of samples of any SEM system. All the Quanta SEM systems can be equipped with analytical systems, such as energy dispersive spectrometer, wavelength dispersive x-ray spectroscopy and electron backscatter diffraction. In addition, the field emission gun (FEG) systems contain a S/TEM detector for bright-field and dark-field sample imaging. Another variable that changes amongst the SEM systems is the size of the motorized stage (50mm, 100mm, and 150mm) and the motorized z-range (25mm, 60mm, and 65mm, respectively). The Quanta 650 and 650 FEG are each designed with a roomy chamber, enabling the analysis and navigation of large specimens.
The Quanta SEM line now includes even more flexibility with the release of the Quanta 50 Series. These new instruments, the Quanta 250, 450, 650, and 650 FEG address the need to investigate a wide variety of materials and characterize structure and composition. The FEI Quanta™ 50 series provides flexibility and versatility to handle the challenges of today's wide ranging research needs. View any sample and get all the data - surface and compositional images can be combined with accessories for determining material properties and elemental composition.
General Specifications
There are no General Specifications available.
Series Modals
FEI Company - 250 FEG, 450 FEG, and 650 FEG
[+] View Model SpecificationsMagnification | 20 to 1000000 x |
Accelerating voltage | 0.2 to 30 kV |
Electron Microscope Type | SEM |
Probe Current | up to 2 µA, continuously adjustable |
Microscope Type | Electron |
Additional Model Specifications | Resolution High vacuum: - 0.8 nm at 30 kV (STEM)* - 1.0 nm at 30 kV (SE) - 2.5 nm at 30 kV (BSE) - 3.0 nm at 1 kV (SE) High vacuum with beam deceleration option: - 3.0 nm at 1 kV (BD mode* + BSE) - 2.3 nm at 1 kV (BD mode* + ICD*) - 3.1 nm at 200 V (BD mode* + ICD*) Low vacuum: - 1.4 nm at 30 kV (SE) - 2.5 nm at 30 kV (BSE) - 3.0 nm at 3 kV (SE) Extended vacuum mode (ESEM): - 1.4 nm at 30 kV (SE) Chamber Size: 284mm-379mm inner diameter left to right |
FEI Company - 250, 450, and 650
[+] View Model SpecificationsMagnification | 20 to 1000000 x |
Accelerating voltage | 0.2 to 30 kV |
Electron Microscope Type | SEM |
Probe Current | up to 2 µA, continuously adjustable |
Microscope Type | Electron |
Additional Model Specifications | Resolution High vacuum: - 3.0 nm at 30 kV (SE) - 4.0 nm at 30 kV (BSE) - 10.0 nm at 3 kV (SE) High vacuum with beam deceleration option: - 6.2 nm at 3 kV (BD mode* + vCD*) Low vacuum: - 3.0 nm at 30 kV (SE) - 4.0 nm at 30k V (BSE) - 10 nm at 3 kV (SE) Extended vacuum mode (ESEM): - 3.0 nm at 30 kV (SE) Magnification: Chamber Size: 284mm-379mm inner diameter left to right |