JEOL - JSM-6010LA InTouchScope™
Manufactured by JEOL
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The InTouchScope™ offers a whole new SEM experience with the familiar look and feel of today’s personal electronic media.
The InTouchScope™ offers a whole new SEM experience with the familiar look and feel of today’s personal electronic media.
The intuitive multi-touch screen interface puts all SEM “Apps” at the operator’s fingertips. The user can expand windows and images with the sweep of two fingers, dial in magnification and focus with a swipe, and select operating parameters, analytical functions, or measure distances just by tapping the PC or notebook touch screen.
An analytical, low vacuum Scanning Electron Microscope (SEM), the InTouchScope features integrated Energy Dispersive Spectroscopy (EDS) with the latest Silicon Drift Detector (SDD) technology.
Ease of use is a key feature of all JEOL SEMs, and the versatile InTouchScope has functions that users of all levels will appreciate.
The intuitive multi-touch screen interface puts all SEM “Apps” at the operator’s fingertips. The user can expand windows and images with the sweep of two fingers, dial in magnification and focus with a swipe, and select operating parameters, analytical functions, or measure distances just by tapping the PC or notebook touch screen.
An analytical, low vacuum Scanning Electron Microscope (SEM), the InTouchScope features integrated Energy Dispersive Spectroscopy (EDS) with the latest Silicon Drift Detector (SDD) technology.
Ease of use is a key feature of all JEOL SEMs, and the versatile InTouchScope has functions that users of all levels will appreciate.
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Documents & Manuals
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Features of JSM-6010LA InTouchScope™
- automatic SEM condition setup based on sample type
- simultaneous multiple live image and movie capture
- easy sample navigation at 5x – 300,000x magnifications
- quantitative and qualitative elemental analysis
- low and high vacuum operation
- Wireless capability
- portable, compact, small footprint SEM
General Specifications
| Accelerating voltage | 0.5 to 20 kV |
| Electron Microscope Type | SEM |
| Microscope Type | Electron |
Additional Specifications
Resolution(HV): 4.0nm @ 20kV
8nm (3kV)
15nm (1kV)
Resolution(LV): 5.0nm @ 20kV
Magnification: x5 to x300,000
LV detector: BSED (std.)
LV-SED (option)
LV pressure: 10 to 100 Pa
Specimen stage: LGS - Eucentric
X / Y: 80/40mm
Z (WD): 5~48mm
T: -10° to +90°
Maximum specimen size: Observation:125mm
Maximum:152mm
Height:49mm
PC: Notebook or Desktop Type (Touch Screen)
Display size: TBD
Frame Store: 640×480
1280×960
2560×1920
5120×3840
GUI Display: 1280×800
EDS: Standard (LA Version)