Designed for Performance and Versatility  The sample positioning stages of the system are designed to accommodate samples up to 10 mm thick, while providing precise sample positioning with >3 mm range in all three directions (XYZ). In addition, the mechanical coupling of the sample stage and the transducer provides a stable, rigid platform for nanomechanical testing. Overall, this low-profile instrument allows for maximum stage tilt and minimum working distance for optimal imaging during testing. 

In-Situ Mechanical Data Synchronized with SEM Imaging  In-situ mechanical data acquired with the PI 85L is synchronized with SEM imaging and displayed in side by side format. In the example at left, discontinuities in the load-displacement data are correlated to the onset of fracture observed in a FIB-milled beam containing copper interconnects and brittle dielectric material. Simultaneous mechanical measurements and SEM imaging enables a complete understanding of material deformation behavior. 

Explore Behavior with Precise Modes  The PI 85L utilizes a multitude of different modes to test fundamental mechanical properties, stress-strain behavior, stiffness, fracture toughness, and deformation mechanisms in a variety of different samples. 

Expand Capabilities with Hybrid Techniques  In addition to the standard line-up of testing modes, the PI 85L can be upgraded with optional modes that further expand its capabilities. From heating options to electrical characterization, the PI 85L can adapt to your needs.