Bruker Optics - NanoWizard Ultra Speed 2 AFM
Manufactured by Bruker Optics
High-speed AFM combined with advanced optical microscopy
A new benchmark: True atomic resolution and high-speed imaging with 10 frames/sec
The JPK NanoWizard® ULTRA Speed 2 delivers exceptional performance and unmatched user-friendliness. It reaches speed levels previously unattainable with traditional AFMs and combines true atomic resolution and fastest scanning with rates of 10 frames/sec. Real-time, in-situ experiments can be performed in combination with advanced optics. A broad range of modes and accessories makes the system highly flexible and upgradable.
High-speed imaging of surface structures up to 8µm with outstanding resolution and stability
The system comes with the lowest noise and highest stability available on the market to provide true atomic resolution. Direct force control at ultra-low forces prevents damage to your samples and probes. With the state-of-the-art position sensor technology, the system delivers highest accuracy and maximum precision.
Until now, performing dynamic experiments on living cells, highly corrugated samples or steep surface structures with highest spatial and temporal resolution was challenging. With our new NestedScanner technology, cells, bacteria or structured surfaces with samples heights up to 8µm can now be examined at the highest scan speeds.
PeakForce Tapping – The gold standard for easy imaging
PeakForce Tapping enables even inexperienced users to precisely control probe-to sample interactions and minimize imaging forces. This is vitally important for soft, and fragile biological samples. This superior force control results in the most consistent, highest resolution AFM imaging, and is suitable for the widest range of sample types. Using PeakForce Tapping, crystal-clear images can be obtained with just a few clicks, and without any expert knowledge or cantilever tuning necessary. Never before has it been so easy to image a sample.
New tiling functionality for automated mapping of large sample areas
Enhance your system with the HybridStage™ to perform automated mapping of large large samples areas. The HybridStage frees experiments from the constraints of the AFM piezo range. Large-range tiling of optical images provides a clear visual overview, allowing a fast setup of optically guided experiments and direct selection of the optical features for investigation.
Navigate around the sample, collect a list of interesting features for Multiscan, or even map force responses over greatly extended scan ranges.
The HybridStage is a newly developed modular, piezobased sample scanner stage combined with motorized XY sample movement, giving direct access to anything you can see. The highly versatile solution for all your sample requirements.
Revolutionary new workflow-based user interface with V7 software
The new software interface guides users through the workflow to set up experiments intuitively and makes it simple, even for users with minimal AFM experience, to progress confidently to generating high-quality data. Each stage of the setup and operation works as an optimized desktop that brings all the vital information into focus with a single click.
Perfect integration and correlated data with advanced fluorescence microscopy platforms
The combination of AFM with the Nobel prize-winning super-resolution technologies (STED, PALM/ STORM) provides enhanced imaging capabilities.
The NanoWizard ULTRA Speed 2, with its unique tip-scanning technology, can also be integrated with single molecule techniques like FRET, FCS, FLIM, TIRF to provide additional optical data sets when performing dynamic experiments on living cells or molecules. Correlation with other advanced optical techniques like confocal, spinning disc, and structured illumination techniques (SIM), combined with livie cell imaging, makes this system the perfect choice for applications in medical, biophysical, chemical or material research.
The newly enhanced DirectOverlay 2 software module enables the direct correlation of AFM and optical data. The capabilities of our calibration algorithms, visualization routines and usability have all been expanded to provide the most user-friendly functionality available today.
Flexibility and modularity - essential requirements for a modern research lab
The new system comes with more accessories and modes than any other AFM platform, each specifically developed to suit the broadest range of applications.
The JPK NanoWizard® ULTRA Speed 2 delivers exceptional performance and unmatched user-friendliness. It reaches speed levels previously unattainable with traditional AFMs and combines true atomic resolution and fastest scanning with rates of 10 frames/sec. Real-time, in-situ experiments can be performed in combination with advanced optics. A broad range of modes and accessories makes the system highly flexible and upgradable.
High-speed imaging of surface structures up to 8µm with outstanding resolution and stability
The system comes with the lowest noise and highest stability available on the market to provide true atomic resolution. Direct force control at ultra-low forces prevents damage to your samples and probes. With the state-of-the-art position sensor technology, the system delivers highest accuracy and maximum precision.
Until now, performing dynamic experiments on living cells, highly corrugated samples or steep surface structures with highest spatial and temporal resolution was challenging. With our new NestedScanner technology, cells, bacteria or structured surfaces with samples heights up to 8µm can now be examined at the highest scan speeds.
PeakForce Tapping – The gold standard for easy imaging
PeakForce Tapping enables even inexperienced users to precisely control probe-to sample interactions and minimize imaging forces. This is vitally important for soft, and fragile biological samples. This superior force control results in the most consistent, highest resolution AFM imaging, and is suitable for the widest range of sample types. Using PeakForce Tapping, crystal-clear images can be obtained with just a few clicks, and without any expert knowledge or cantilever tuning necessary. Never before has it been so easy to image a sample.
New tiling functionality for automated mapping of large sample areas
Enhance your system with the HybridStage™ to perform automated mapping of large large samples areas. The HybridStage frees experiments from the constraints of the AFM piezo range. Large-range tiling of optical images provides a clear visual overview, allowing a fast setup of optically guided experiments and direct selection of the optical features for investigation.
Navigate around the sample, collect a list of interesting features for Multiscan, or even map force responses over greatly extended scan ranges.
The HybridStage is a newly developed modular, piezobased sample scanner stage combined with motorized XY sample movement, giving direct access to anything you can see. The highly versatile solution for all your sample requirements.
Revolutionary new workflow-based user interface with V7 software
The new software interface guides users through the workflow to set up experiments intuitively and makes it simple, even for users with minimal AFM experience, to progress confidently to generating high-quality data. Each stage of the setup and operation works as an optimized desktop that brings all the vital information into focus with a single click.
Perfect integration and correlated data with advanced fluorescence microscopy platforms
The combination of AFM with the Nobel prize-winning super-resolution technologies (STED, PALM/ STORM) provides enhanced imaging capabilities.
The NanoWizard ULTRA Speed 2, with its unique tip-scanning technology, can also be integrated with single molecule techniques like FRET, FCS, FLIM, TIRF to provide additional optical data sets when performing dynamic experiments on living cells or molecules. Correlation with other advanced optical techniques like confocal, spinning disc, and structured illumination techniques (SIM), combined with livie cell imaging, makes this system the perfect choice for applications in medical, biophysical, chemical or material research.
The newly enhanced DirectOverlay 2 software module enables the direct correlation of AFM and optical data. The capabilities of our calibration algorithms, visualization routines and usability have all been expanded to provide the most user-friendly functionality available today.
Flexibility and modularity - essential requirements for a modern research lab
The new system comes with more accessories and modes than any other AFM platform, each specifically developed to suit the broadest range of applications.
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Features of NanoWizard Ultra Speed 2 AFM
- High-speed imaging with 10 frames/sec with excellent resolution * Now with Bruker’s exclusive PeakForce Tapping as standard * Revolutionary new workflow-based user interface for ergonomics and ease of operation * New tiling functionality for automated mapping of large sample areas together with the HybridStage * Unique integration with optical microscopy by tip-scanning design and the newly enhanced DirectOverlay 2 mode for most precise correlative microscopy * New Vortis 2 controller with high-speed low-noise DACs and cutting-edge position sensor readout technology * Highest flexibility and upgradeability with a broad range of modes and accessories
General Specifications
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