BioMAT™ Workstation - combining AFM and upright optical microscopy with uncompromised performance for opaque samples 
The main problem limiting correlative microscopy on non-transparent samples has been providing simultaneous access for both techniques at the sample surface. In order to achieve the full capabilities of optical microscopy, objective lenses with an extremely short working distance are required, which leaves no space for AFM to access the same location. JPK’s BioMAT™ workstation now provides a solution which integrates the specific advantages of both upright optical microscopy and AFM. 
 
JPKs NanoWizard® AFM provides outstanding performance. As well delivering high resolution imaging, unmatched characterization of the nano-mechanical and nano-electrical sample properties can also be achieved. With the BioMAT™ workstation, the AFM possibilities can be enhanced by nearly all upright microscopy techniques (brightfield, DIC, fluorescence, confocal laser scanning, FLIM FRET, FRAP, FCS, IR, Raman …) 
 
BioMAT™ shuttle stage – flexibility meets precision 
The key element of the BioMAT™ Workstation design is a portable shuttle stage that carries the actual sample. The transfer of the shuttle stage from AFM to the microscope, or vice versa, allows precise transport of the sample between the field of view of the optics and the AFM scan range without losing position. This transfer can be repeated as often as necessary, allowing the sequential measurement of optics and AFM for time lapse studies. By using dipping lenses for the upright microscope, the setup is compatible with in-fluid operation. 
 
Biology and engineering: a whole new world of applications 
The JPK BioMAT™ Workstation provides the ideal solution for the investigation of samples on non-transparent substrates, for example bacterial growth studies on metallic surfaces or studies on tissue sections. Even beyond biological investigations, the combination with optics provides added value for applications in surface chemistry and polymer sciences, nano-electrical measurements on semiconductors, or micromechanical (MEMS/NEMS) systems. 
 
Combination with confocal laser scanning microscopy 
The combination of cutting edge optical microscopes, such as the Olympus LEXT OSL4100 [5], with high resolution AFM employs novel, experimental schemes in which quick and precise sample surveys may be combined with nm-scale, quick testing of geometry and secondary sample properties such as mechanical, electrical and magnetic characteristics.