Bruker Optics - NanoWizard 4 Nanoscience AFM
Manufactured by Bruker Optics
The world's most flexible AFM
Highest performance meets utmost flexibility
Today’s research topics in nanoscience are complex. Therefore a highly flexible AFM system is the first choice. With the new NanoWizard® 4 AFM you are well prepared for any future research project. The system comes with a wide range of modes and accessories for environmental control, mapping of nanomechanical, electrical, magnetic or thermal properties and seamless integration with advanced optical techniques. As a result of JPK‘s leading tip-scanner technology and our consistent modular design philosophy, the NanoWizard® 4 is the most flexible system available on the market today.
Fast scanning capabilities for increased productivity - observe sample dynamics in real-time
The NanoWizard® 4 NanoScience AFM combines closed-loop atomic resolution with fast scanning capabilities of up to 3 sec/image in a system and comes with a large scan range of 100µm in XY. It has the lowest noise levels of a closed-loop scanner and deflection detection system. The powerful digital Vortis™ controller combines fast signal handling with lowest noise.
Enhance productivity, probe more sample areas in same time
Do a quick survey over your sample
Observe changes following sample dynamics in real time
Perform time lapse studies on polymers, thin films, advanced materials, capsules and others
Quantitative characterization of mechanical properties
As an expert in force measurements, JPK provides a complete set of methods to characterize mechanical properties. We have the right solution, in particular for very soft or delicate samples or for samples under an external load. JPK's QI™ mode, with its linear Z-movement and a full set of quantitative data in every pixel, allows the extraction of quantitative data such as elasticity, adhesion, dissipation, chemical forces or conductivity. The automated large Z-adjustment has been developed for swelling samples or with a rough topography. The enhanced data analysis capabilities - in particular for modulus calculation with a variety of selectable models - is of great benefit.
Enhanced mapping of material properties
The characterization of electrical, electromechanical or magnetic sample properties was always a difficult task, in particular on loosely attached, brittle or soft samples. JPK's enhanced QI™-Advanced mode capabilities now make this easy and straight forward. The new system comes with a new Conductive AFM and Kelvin Probe (KPM) module with an enclosed volume which provides a controlled gas environment for the sample. An to round it all off, the NanoWizard® 4 system comes with enhanced STM, Piezo-Response (PFM), Scanning-Thermal AFM and electrochemistry options.
Today’s research topics in nanoscience are complex. Therefore a highly flexible AFM system is the first choice. With the new NanoWizard® 4 AFM you are well prepared for any future research project. The system comes with a wide range of modes and accessories for environmental control, mapping of nanomechanical, electrical, magnetic or thermal properties and seamless integration with advanced optical techniques. As a result of JPK‘s leading tip-scanner technology and our consistent modular design philosophy, the NanoWizard® 4 is the most flexible system available on the market today.
Fast scanning capabilities for increased productivity - observe sample dynamics in real-time
The NanoWizard® 4 NanoScience AFM combines closed-loop atomic resolution with fast scanning capabilities of up to 3 sec/image in a system and comes with a large scan range of 100µm in XY. It has the lowest noise levels of a closed-loop scanner and deflection detection system. The powerful digital Vortis™ controller combines fast signal handling with lowest noise.
As an expert in force measurements, JPK provides a complete set of methods to characterize mechanical properties. We have the right solution, in particular for very soft or delicate samples or for samples under an external load. JPK's QI™ mode, with its linear Z-movement and a full set of quantitative data in every pixel, allows the extraction of quantitative data such as elasticity, adhesion, dissipation, chemical forces or conductivity. The automated large Z-adjustment has been developed for swelling samples or with a rough topography. The enhanced data analysis capabilities - in particular for modulus calculation with a variety of selectable models - is of great benefit.
Enhanced mapping of material properties
The characterization of electrical, electromechanical or magnetic sample properties was always a difficult task, in particular on loosely attached, brittle or soft samples. JPK's enhanced QI™-Advanced mode capabilities now make this easy and straight forward. The new system comes with a new Conductive AFM and Kelvin Probe (KPM) module with an enclosed volume which provides a controlled gas environment for the sample. An to round it all off, the NanoWizard® 4 system comes with enhanced STM, Piezo-Response (PFM), Scanning-Thermal AFM and electrochemistry options.
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Features of NanoWizard 4 Nanoscience AFM
- Fast scanning of up to 100 lines/sec and time per frame up to 3s for tracking dynamic processes * Atomic lattice resolution on inverted microscopes with a large scan field of 100×100×15 µm3 * Outstanding high-resolution quantitative imaging made easy by QI™ Mode, for the most challenging of AFM samples * Industry-leading technology intergrating optical microscopy in real time * Unique solutions for the characterization of mechanical and electrical sample properties * Widest range of modes and accessories of any AFM
General Specifications
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