Bruker Optics - Dimension FastScan Pro
Manufactured by Bruker Optics
High-Resolution Imaging & Most Precise Measurements>PeakForce Tapping® enables consistent,...
High-Resolution Imaging & Most Precise Measurements
PeakForce Tapping® enables consistent, high-resolution AFM imaging.
Unique technology enables pinpoint force to any atom on your sample.
The most precise probe-sample control permits widest range of sample types, from soft polymers, thin films and electrical samples to very hard materials.
Precise probe-to-sample control and unique probe technologies.
Provide the lowest available imaging forces and long probe tip life over hundreds of engages and data scans.
Unique, Quantitative Results, Whatever You Measure
PeakForce Tapping’s piconewton force sensitivity provides quantitative data.
Measure sub-nanometer steps to high-aspect ratio trenches.
Highest resolution AFM topography achieves nanometer step metrology with Angstroms resolution. In addition, Bruker industrial probes and PeakForce Tapping enable High Aspect Ratio depth metrology not available with other systems in this class.
Analyze high volumes of data with consistent resolution in production.
Dimension platform enables loading single large or multiple smaller samples for efficiency and higher throughput maintaining FastScan and Icon technology performance.
Easy to Use, Making Every User an AFM Expert
Achieve precise, accurate measurements, whatever your AFM experience level
Eliminate the complexity of AFM operation.
ScanAsyst algorithms in conjunction with AutoMET software automatically and continuously monitor the image quality and make needed parameter adjustments.
Automate measurements on multiple samples.
AutoMET™ full-recipe software delivers fast, automated metrology, simple operation, and AFM adaptability for easy capture of critical-to-quality measurements.
PeakForce Tapping® enables consistent, high-resolution AFM imaging.
Unique technology enables pinpoint force to any atom on your sample.
The most precise probe-sample control permits widest range of sample types, from soft polymers, thin films and electrical samples to very hard materials.
Precise probe-to-sample control and unique probe technologies.
Provide the lowest available imaging forces and long probe tip life over hundreds of engages and data scans.
Unique, Quantitative Results, Whatever You Measure
PeakForce Tapping’s piconewton force sensitivity provides quantitative data.
Measure sub-nanometer steps to high-aspect ratio trenches.
Highest resolution AFM topography achieves nanometer step metrology with Angstroms resolution. In addition, Bruker industrial probes and PeakForce Tapping enable High Aspect Ratio depth metrology not available with other systems in this class.
Analyze high volumes of data with consistent resolution in production.
Dimension platform enables loading single large or multiple smaller samples for efficiency and higher throughput maintaining FastScan and Icon technology performance.
Easy to Use, Making Every User an AFM Expert
Achieve precise, accurate measurements, whatever your AFM experience level
Eliminate the complexity of AFM operation.
ScanAsyst algorithms in conjunction with AutoMET software automatically and continuously monitor the image quality and make needed parameter adjustments.
Automate measurements on multiple samples.
AutoMET™ full-recipe software delivers fast, automated metrology, simple operation, and AFM adaptability for easy capture of critical-to-quality measurements.
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