Bruker Optics - QUANTAX Micro-XRF

Manufactured by  Bruker Optics
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Upgrading SEMs for Trace Element Analysis

QUANTAX Micro-XRF with the XTrace micro-spot X-ray source adds the capabilities of a complete micro-XRF spectrometer to a scanning electron microscope. XTrace fits on a free inclined chamber port of almost any SEM. The user benefits from both the trace element sensitivity and the higher information depth of XRF analysis. 
 
The user friendly Micro-XRF system for SEM 
  • Distribution analysis with HyperMap stores complete spectra for every map point for on- and offline analysis 
  • Samples can be analyzed with Micro-XRF and EDS without position change 
  • Both methods are integrated in the same analytical software suite - ESPRIT 2.0 
  • No interference with normal SEM operation, XTrace can stay in its measurement position most of the time. 
     
  • A complete micro-XRF spectrometer without the investment 
  • Analytical results compare to those of standalone systems 
  • Image tiling allows mapping large areas 
  • Selectable primary radiation filters to suppress diffraction peaks 
  • Uses the SEM motorized stage 
  • Allows sample tilt to produce minimum spot sizes.
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