Shimadzu - inspeXio SMX-225CT FPD HR Micro-Focus X-Ray Computed Tomography System

Manufactured by  Shimadzu
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For High-Resolution and High-Contrast Micro-Focus X-Ray Computed Tomography Applications

The inspeXio SMX-225CT FPD HR is a highly versatile micro-focus x-ray computed tomography system that produces high-contrast and high-resolution x-ray images for accurate internal structure analysis of materials, from aluminum die-cast parts to carbon fiber reinforced plastics. 
 
The proprietary control and reconstruction software facilitates intuitive operation and high-throughput data analyses by automatically optimizing the scan parameters. 
 
In addition, it is easy to load and position samples, and the high-performance computing system aids in testing many samples in a small amount of time.
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Features of inspeXio SMX-225CT FPD HR Micro-Focus X-Ray Computed Tomography System

Easy Sample Loading and Parameters Setting for Quick Initiation  An observation camera guides sample loading and positioning, and parameter setting is completed quickly by choosing the material and image quality. With no need for calibration, the system is initialized quickly and intuitively. 

Improved Productivity  The inspeXio SMX-225CT FPD HR system’s high-performance computing system significantly reduces analysis time by running data collection and calculation in parallel. Computational processing for the newest HPC inspeXio system is approximately 50 times faster than the previous version. 

Clear and Detailed Images for Precise Analysis  The large and high-resolution flat panel detector achieves up to 14-megapixel input resolution. The acquired projection data can be composed of up to 4,096 matrix sizes. 

Application Versatility  The inspeXio SMX-225CT FPD HR can analyze a wide variety of samples. Large samples up to 400 mm in diameter with a maximum height of 300 mm can be accommodated and, due to the 225 kV maximum penetration ability, even iron plates that are one-inch thick are penetrated. In addition, the combination of a larger detector with a wide dynamic range and a newly designed x-ray tube window results in high-contrast images of low-density materials. Furthermore, various CT scan modes aid in analysis of different-sized samples without damaging or losing magnification.

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