World´s First 250µm Mapping      Patented by Shimadzu, this local analysis technology allows easy data comparison, and enables content distribution and intensity distribution analyses of non-uniform samples. An optional CCD camera provides enhanced observation.     

Qualitative/Quantitative Analysis Using Higher-order X-Rays      This patented technique enables:     

• Simultaneous measurement of the normal first-order X-ray profile and the higher order X-ray profile     * More accurate evaluation of higher-order X-rays     * Independent or superimposed display during off-line data processing of the first-order X-ray profile and the higher order X-ray profile     

  Film Thickness Measurement and Inorganic Component Analysis      For high-polymer thin films using the background FP method (patented).     

  Patented Sample Loading System – Eliminates transport problems     

  Ultra-fast Scanning (300°/min)      With simple operations and the ultra-fast function, easy qualitative/quantitative analysis is rapidly achieved.     

  Ease of Use      Templates and comprehensive matching functions simplify condition settings and analysis.     

  Superb Design/Functionality      Designed to meet a variety of analytical needs, the XRF-1800´s design include:     * New optical system     * 4 kW Thin-window X-ray Tube – Installed as standard, it enhances sensitivity for all elements; compared with a conventional 3 kW tube, sensitivity is more than doubled for light elements     * Five Types of Primary X-ray Filters     * Accurate Temperature Control     * Vacuum Stabilizer     * Continuous Monitoring System – Ensures easy maintenance