Hitachi - Vortex®-EM X-ray Detector

Manufactured by  Hitachi
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Vortex®-EM detectors are produced from high purity silicon using state-of-the-art CMOS production technology. They...

Vortex®-EM detectors are produced from high purity silicon using state-of-the-art CMOS production technology. They feature excellent energy resolution (<130 eV FWHM at Mn KΑ is typical) and a high count rate capability. At 0.1 µs PT with an output count rate of 900 kcps is achieved. A unique feature of these detectors is their ability to process high count rates with very small loss in energy resolution and minimal peak shift with count rate.
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Features of Vortex®-EM X-ray Detector
  • Extended probe (300 mm) * Available in 30, 40, 50, 65, 70, 80 mm2 * Available in thickness of 0.5 and 1 mm * Superb energy resolution * Detector temperature stabilization * Additional sizes are available under special contracts * Small and compact package for minimum vibration * Digital pulse processor (DPP) with PI-SPEC Software * Equipped with an ion pump * RoHS Compliant
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