Hitachi - High-Sensitivity Element Monitor EA1200VX

Manufactured by  Hitachi
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The EA1200VX High-Sensitivity Element Monitor supports a wide range of applications from RoHS/ELV compliance screening...

The EA1200VX High-Sensitivity Element Monitor supports a wide range of applications from RoHS/ELV compliance screening to advanced analysis. Equipped with a unique XRF detector, the Vortex, which features high resolution, sensitivity and count rate, the EA1200VX has remarkably improved overall sensitivity. Using the instrument in combination with the precision control software greatly shortens measurement time.
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Features of High-Sensitivity Element Monitor EA1200VX

Phenomenal High Speed Analysis (High Sensitivity)  Measurement times can be greatly shortened, typically to one tenth the time of conventional methods, by combining the high count rate detector and precision control software. 

High Count Rate Detector—No LN2 Needed  The EA1200VX is equipped with the world's best high count rate detector "Vortex" which samples at a rate of 150,000 cps and does not require LN2, resulting in an unprecedented level of sensitivity and resolution. 

Time-Saving Uni Filter (Optional)  Up to five RoHS restricted elements can be measured at one time using a single composite filter, achieving even shorter measuring times from the already rapid measuring time of the EA1200VX. 

Wide Range of Application 

Measurement of Na to U element is possible by performing measurements in a vacuum condition (with the Light Element Option). This feature also supports highly sensitive analysis of Cl. 

Micro Spot Analysis  With a 1-mmΦ x-ray beam, the EA1200VX can perform qualitative and quantitative analyses of micro spots on a printed circuit board. 

Sample Changer  The optional sample changer enables the continuous measurements of up to 12 samples even under varying measurement conditions. (Optional) Large samples of up to 430 mm × 320 mm in size can also be measured.

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