Optimized detector switching enhances measurement accuracy  Multiple detectors are installed in the integrating sphere to perform measurements over a wide range of wavelengths, from ultraviolet to visible to near infrared regions. The changes in photometric values at detector switching (from signal level differences) are minimized due to a new design utilizing Hitachi's expertise in integrating sphere construction and signal processing technologies. 

Low stray light and low polarization characteristics attained through Hitachi's high-performance prism-grating double monochromator system  The UH4150 adopts a prism-grating (P-G) double monochromator optical system, inherited from the highly evaluated U-4100. Large changes in light intensity of the S and P polarization are minimized with a (P-G) configuration. The UH4150 can perform low noise measurements, even with low transmittance and reflectance samples. 

Collimated beam for accurate measurement of reflected and scattered light  The incident angle is important for the measurement of specular reflectance of solid samples. For a focused light beam, the incident angle varies depending on the factors such as the lens's focal length. Consequently, the values of simulation of design of optical thin films, such as dielectric multilayer film and prism, would differ from actual measured values. With a collimated beam, however, the incident angle is always the same with respect to the sample, leading to a highly accurate measurement of specular reflectance. Furthermore, the collimated light beam is useful for the evaluation of diffusivity (haze) and the measurement of transmittance of lenses. 

A wide variety of detectors to meet a broad range of measurements and applications  Eight types of integrating spheres of different materials, sizes, and shapes are available. 

New ergonomic design  The sample compartment door utilizes an ergonomic design for improved sample exchange. 

Compatible accessories  Many removable accessories for the U-4100 can also be used with Model UH4150. 

Improved throughput  While inheriting the high-performing optical system of the model U-4100, the UH4150 provides higher throughput measurements. In the previous model, a scan speed of 600 mm/min was necessary for a measurement using a data interval of 1 nm. With Model UH4150, you can measure at 1-nm intervals while using a scan speed of 1,200 nm/min, reducing the measurement time significantly. The UH4150 measures from 240 to 2,600 nm in approximately two minutes. It is effective for samples requiring measurement in UV-VIS-NIR wavelength range, such as solar reflective materials.