Hitachi - Ion Milling System ArBlade 5000

Manufactured by  Hitachi
Follow this Equipment

The most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat-milling samples...

The most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat-milling samples for electron microscopy.
Active Questions & AnswersAsk a Question

There are no current Discussions

Electron Microscopes Service ProvidersView All (8)

Request Support
Documents & Manuals

There are no Documents or Manuals available.

Features of Ion Milling System ArBlade 5000

Cross-section milling rate: 1 mm/hour!*1  The ArBlade 5000 is equipped with a fast-milling Ar ion gun with a milling rate twice as high for cutting-edge performance, thus dramatically reducing the processing time for cross-section preparation. 

*1Si protrudes 100 um from the mask edge. 

Comparison of cross-section milling  (Specimen: lead for mechanical pencil, Milling time : 1.5 hours) 

Cross-section widths up to 8 mm!  For large-area milling requirements such as electronic-device applications, a revolutionary cross-section milling holder design has been developed for wider-area fabrication. 

Example of wide-area cross-section milling  (Specimen: electronic component, Milling time: 5 hours) 

Hybrid Model: Dual-Milling Configuration Available  The all new ion-milling system is equipped with both cross-section milling and flat milling modes for the most complex application needs.  Equipped with multiple holders, the ArBlade 5000 system accommodates a wide range of applications. 

Cross-section Milling  Used to produce wider, undistorted cross sections without applying mechanical stress to the sample 

Flat Milling  Used for removing surface layer artifacts and final polish after traditional mechanical polishing techniques.

General Specifications
Accelerating voltage0 to 8 kV
Electron Microscope TypeFIB
Microscope TypeElectron

Looking for New or Used Equipment?

Shop on LabX

Shop on Labx.com