Hitachi - Probe Station AFM5000II / Real TuneII
Hitachi AFM5000II includes the control system and software package to allow a wealth of advanced imaging and data...
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Features of Probe Station AFM5000II / Real TuneII
1. RealTuneII Auto Tuning Functions for Optimal Measurement Parameters The improved auto tuning function systematically and efficiently monitors sample topography, scanning area, the cantilever, and the scanner to determine the best operating conditions. As the measurement parameters are optimized, the cantilever’s vibration amplitude and operation frequency are automatically adjusted based on the sample and cantilever type. The new and improved auto tuning algorithm offers reliable and precise images with a simple point-and-click!
One-click automatic measurement * Automatic tuning function for various samples
2. New GUI (Graphical Use Interface) * Intuitive and logical control icons balance the screen layout with information provided for ultra-efficient, productive, and easy AFM operation for all levels of users. * Measurement and analysis tabs provide organized and spacious work areas on the monitor display.
- Analysis Functions The 3D Overlay Function enables the observation of “cause and effect relationship” between topography and physical properties. A variety of other functions, such as roughness and cross-section analysis, are also standard tools. * Roughness and cross-section profile analysis
4. Desktop Design Small form factor for flexible, efficient space usage. (220mm(W)×500mm(D)×385mm(H),approximately 15kg)
General Specifications
Microscope Type | Atomic Force |