Hitachi - Real-time 3D analytical FIB-SEM NX9000
Manufactured by Hitachi
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FIB-SEM System for True 3D Structural Analysis
The newly developed FIB-SEM system from Hitachi, the NX9000 incorporates an optimized layout for true high-resolution serial sectioning to tackle the latest demands in 3D structural analysis and for TEM and 3DAP analyses. The NX9000 FIB-SEM system allows the highest precision in material processing for a wide range of areas relating to advanced materials, electronic devices, biological tissues, and a multitude of other applications.
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Features of Real-time 3D analytical FIB-SEM NX9000
- The SEM column and FIB column are orthogonally arranged to optimize the column positioning for 3D structural analysis. * The combination of high-brightness cold-field-emission electron source and high-sensitivity optics support analysis of a wide range of materials from biological tissues to magnetic materials. * The Micro-sampling system and Triple Beam system allow high-quality sample preparation for TEM and atom-probe applications.
General Specifications
| Electron Microscope Type | SEM-FIB |