Analytik Jena - SPEKOL 2000
Manufactured by Analytik Jena
The smallest, most robust double beam spectrophotometer
The UV VIS spectrophotometer SPEKOL® 2000 is a double beam system with variable slit width in a spectral range of 190 - 1100 nm with an outstanding price-performance ratio.
The SPEKOL 2000, with its variable slit widths of 0.5, 1, 2 and 4 mm in the 190-1100 nm range with no warm-up phase, is suitable for the most diverse applications and daily routine.
As a genuine double beam instrument with innovative optics, it stands out by virtue of its excellent value for money and a minimal space requirement.
Measurement of transmission, absorption, concentration via factor, simple standard or linear calibration is simple and quick to implement with this system.
The SPEKOL 2000, with its variable slit widths of 0.5, 1, 2 and 4 mm in the 190-1100 nm range with no warm-up phase, is suitable for the most diverse applications and daily routine.
As a genuine double beam instrument with innovative optics, it stands out by virtue of its excellent value for money and a minimal space requirement.
Measurement of transmission, absorption, concentration via factor, simple standard or linear calibration is simple and quick to implement with this system.
Active Questions & AnswersAsk a Question
2Replies
Software Required for SPEKOL 2000
1Replies
Spekol 2000
Recent Questions & Answers
Updated byquaidian
UV/VIS Spectrophotometers Service ProvidersView All (32)
Documents & ManualsView All Documents
Features of SPEKOL 2000
- Automatic Self Check System
- Control by 32 bit UV VIS software WinASPECT
- Pre-programmed methods ensure problem-free, simple handling even without specialized knowledge
- Double beam system with a variable slit width of 0.5/1/2/4 nm
- Measurement of transmittance, absorbance or concentration via factor, simple standard or linear Calibration
- Spectra measurement
- Kinetic measurement
- Printing and storage of methods and measurement results
- BIO package
Convincing analytical advantages
- Very good signal to noise ratio
- Extremely short measurement times
- Very low detection limit
- Good short-term and long-term stability
- Scanning of spectra, as well as measurements at fixed wavelengths
General Specifications
| Wavelength Range | 190 to 1100 nm |
Additional Specifications
Variable slit widths: 0.5, 1, 2, 4 mm