Anton Paar - TS 600

Manufactured by  Anton Paar
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The TS 600 Tensile Stage is a completely new, advanced sample stage for in-situ X-ray diffraction studies of stress/strain phenomena in fibers, foil..

The TS 600 Tensile Stage is a completely new, advanced sample stage for in-situ X-ray diffraction studies of stress/strain phenomena in fibers, foils and thin films. It is the first commercial sample stage specifically designed for in-situ XRD investigations of structural changes in materials under mechanical load. Because of its compactness and low weight, the instrument can be used on synchotrons as well as on laboratory X-ray diffractometers. And what’s more, it can be operated in transmission and reflection mode to gain new insights into the world of strain and stress.
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Features of TS 600

Exploring the world of mechanical properties 

  • Simultaneous straining and X-ray diffraction * Two different load cells cover a large force range with high resolution * Easy exchange and automatic recognition of load cells * Precise measurement of force and sample elongation 

    Compact and versatile   * Measurements in transmission and reflection geometry * Various sample types, such as fibers, foils, thin sheets, etc * Suitable for synchotrons and commercial X-ray diffractometers * Small size and low weight 

    Easy access to complex information   * User-friendly control and data acquisition software * Programming of complex load profiles possible including cyclic straining and creep experiments * Data can be viewed online in different representations and exported in various formats

General Specifications

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Additional Specifications

Force range  
5 N load cell: 0.05 to 5 N 
600 N load cell: 1 to 600 N 
 
Speed range  
0.05 to 5 mm/min 
 
Angular range  
Ψ ? 20° to 90° (depending on Φ) 
Θ ? 20° to 90° (depending on Φ) 
Φ 0° to ± 180° 
 
Sample size  
Length: min. 30 mm 
Width: max. 15 mm 
Thickness: max. 2 mm 
 
Diameter  
155 mm 
 
Total height  
48.5 mm 
 
Height of sample above base plate  
36 mm 
 
Weight  
1.3 kg 
 
X-ray geometry  
Transmission and reflection

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