HORIBA - XP Examina
The XploRA Examina™ is the highly versatile, yet easy to use Raman microscope targeted at the Forensic analytical sector. It combines optical microsc
The XploRA Examina™ offers simplicity in design and operation so that the Forensic analyst can focus on the sample measurements and routine analysis that is important, obtaining results not just spectra.
It provides class leading sensitivity and confocal detail, full optical microscopy yet requires only minimal operator training and maintenance. With HORIBA’s innovative SWIFT™ Raman chemical imaging system and KIA database as standard the Examina™ is ideally matched to the needs of the busy Forensic Laboratory. The XploRA Examina™ philosophy ensures that Raman has become an even more accessible analytical technique for the Forensic analyst.
Raman in Forensic
Raman is an ideal technique for Forensic science offering high quality data, reliability and significant speed advantages over other analytical techniques. Benefits for the analysis of trace samples not only include the range of samples that can be analysed but also in the non-destructive nature of the analysis. Raman microscopy enables easier comparative analysis, unknown chemical identification and improved value for money.
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Features of XP Examina
The XploRA Examina™ is available in 2 options; the XploRA Examina One™ and the XploRA Examina Plus™, these systems are based on the renown and extremely well tested XploRA ONE and XploRA Plus™ Raman Microscope systems but they have been configured to perfectly match the requirements of Forensic examinations. The XploRA Raman Microscopes have an excellent reputation as highly versatile Raman microscope that combine ease of use with functionality and performance for the analytical lab.
The main features of the two systems are:
- XploRA Examina One™Open * XploRA Examina Plus™Open
General Specifications
There are no General Specifications available.
Additional Specifications
XploRA Examina One™ - package Ref. XP ONE-XPEF-1
Research grade microscope, 10x, 50x objectives, macrosampler, 3MP top camera, reflected and transmitted light illumination, polarised light, motorised XY and Z motor, class (I) safety, computer with pre-installed LS6.3 software, spectral database, 785 nm 100 mW CLDS laser
XploRA Examina Plus™ - package Ref. XP PLUS-XPEF-3
Research grade microscope, 10x, 50x LWD,100x objectives, macrosampler, 3MP top camera, trinoc with eyepieces reflected and transmitted light illumination polarised light, motorised XY and Z motor, class (I) safety, Computer with pre-installed LS6.3 software., spectral database, 532 nm, 638 nm,785 nm CLDS lasers