HORIBA - Nanosizer®
Manufactured by HORIBA
Nanosizer® in Origin® Pro 8 simplifies the process for simulation and analysis for single?walled carbon nanotube excitation?emission map simulation..
Nanosizer® in Origin® Pro 8 simplifies the process for simulation and analysis for single-walled carbon nanotube excitation-emission map simulation and analysis. Nanosizer is used with our Nanolog spectrofluorometers, which are specifically designed for research in nanotechnology and nanomaterials. Nanosizer comes with our patented double-convolution-integral algorithm specially designed for determining chirality and diameter of single-walled carbon nanotubes.
Nanosizer® lets you simulate excitation-emission maps of SWNT near-IR fluorescence to compare to your actual data. Using built-in or custom libraries, Nanosizer® rapidly assigns specific peaks to particular SWNT (n,m) structures, and even generates helical maps. Nanosizer® also greatly simplifies FRET studies of SWNT bundles, length-distribution analyses, and nanotube purification analyses. Nanosizer® even offers a platform suitable to support future ISO and ASTM standards for identification and purification of semiconducting SWNTs.
Nanosizer® lets you simulate excitation-emission maps of SWNT near-IR fluorescence to compare to your actual data. Using built-in or custom libraries, Nanosizer® rapidly assigns specific peaks to particular SWNT (n,m) structures, and even generates helical maps. Nanosizer® also greatly simplifies FRET studies of SWNT bundles, length-distribution analyses, and nanotube purification analyses. Nanosizer® even offers a platform suitable to support future ISO and ASTM standards for identification and purification of semiconducting SWNTs.
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Features of Nanosizer®
- Efficient Region of Interest and Initial Model Parameterization * Virtually unlimited number of peaks * Global linking and fixing of peak parameters * Full constraints on all model peak parameters * Save Themes for rapid model parameterization * 2D analytical line shapes: Gaussian, Lorentzian and Voigt Convolution * Correct statistical weighting of residuals * Fully featured statistical analysis of fit peak parameters * Graphical and tabular presentation of fit results and residuals * Fits data in energy (cm–1, eV) or wavelength (nm) units * Compares peak parameters to user editable library for helix angle, diameter and (n,m)* distribution plots and tables * Designed for ISO and ASTM Standards for Semiconducting SWNT Identification/Quantification
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