Bruker Corporation - HYPERION FT-IR Microscope

Manufactured by  Bruker Corporation
Follow this Equipment

The HYPERION is the culmination of more than 30 years of experience in FT-IR microscopy.

The HYPERION series is a fully upgradeable microscope platform for conducting state-of-the-art optical and infrared analysis. Transmission and reflection capabilities are standard, for ATR and GIR dedicated objectives are available as options.   
  
HYPERION 1000 High performance infrared microscope with manual sample stage    
HYPERION 2000 All the features of HYPERION 1000, with motorized mapping stage for mapping and integrated high resolution color LCD. Motorized z-drive and autofocus are available as options to facilitate ATR mapping and reflection mapping of structural samples.     
 
HYPERION 3000 All the features of the HYPERION 2000, with integrated focal plane array for spectral imaging and single element detectors for single point microscopy.     
Coupling The HYPERION can be coupled to the side port of almost any Bruker Optics spectrometer.Optionally the infrared beam can be passed through the HYPERION to other further accessories.
Active Questions & AnswersAsk a Question

There are no current Discussions

Need Equipment Support?

Request Support
Documents & Manuals

There are no Documents or Manuals available.

Features of HYPERION FT-IR Microscope
  • Sensitivity, Lateral resolution         * Sampling flexibility         * Spectral Range         * Software         * Spectrometer Diagnostic         * Flexible Design
General Specifications

There are no General Specifications available.

Additional Specifications

Spectral range 12,000 to 600 cm-1 (Standard), optional 100 to 25,000 cm-1       
(with appropriate spectrometer and spectral range options)       
Adjustment accuracy Motorized stage provides an adjustment accuracy of ± 0,1 Μm.       
The repeatability is better than ± 1 Μm.       
Visible mode The HYPERION is equipped with trinocular and video camera for visual observation of the samples. Optional visible polarizers can be used to enhance the contrast within a sample. In addition the HYPERION can be operated in the VIS/IR mode allowing simultaneous visual observation and spectral analysis of the sample. 
An optional built-in highresolution color LCD is available for sample observation.       
Measurement area The measurement area is visually selected by adjustment of apertures. The microscope is optimized for analysis of samples with areas up to 170 Μm. The minimal spot size is determined by the diffraction limit of the analyzing radiation and the numerical aperture of the objective used. Typically a spatial resolution of 8 Μm can be achieved in the midinfrared spectral range with the standard objective in transmission or reflection. By using the Ge-ATR-Objective the achieveable lateral resolution can be improved by the factor of 4.       
       
Apertures       
Different apertures are available before and after the sample position as the HYPERION is a confocal microscope. The user can exchange them easily.       
Transparent knife edge apertures (Standard) Automatic, software controlled knife edge apertures Metal knife edge apertures (for NIR microscopy) Aperture wheel with 12 well defined circular apertures sizes (min: 0.3 mm; max: 3.75 mm corresponding       
to 20-250 Μm in the image plane for the standard 15x objective)       
Objectives The HYPERION is equipped with a four position rotatable       
nosepiece. In the standard configuration a 10x binocular and a reflecting 15 Schwarzschild objective are used. The numerical aperture (NA) of 0.4 minimizes spherical aberrations when using windows above the sample. A 4x glass objective for visual observation is also provided.       
   
Available Objectives:       
Standard 15x objective with 24 mm working distance Different glass objectives for visible mode inspection 20x ATR-objective (NA=0.6) - Operates as a high quality reflecting objective as well as an ATR objective GIR-objective (NA = 0,995) - Two pass objective for achieving monolayer detection with maintained polarization       
orientation 36x (NA=0.5) objective for transmission and reflection Illumination Various contrast enhancement mechanisms are available       
on the HYPERION:Aperture stop in the illumination path Darkfield illumination for transmission viewing Fluorescence illumination (optional)Crossed visible polarizers (optional)       
       
Stages       
Manual stage (50 x 75 mm)       
Computer controlled stage (50 x 75 mm or 80 x 100 mm)       
Heatable sample stage       
Temperature controlled stage (-190 to 600° C)       
Purge housing or effective shielding of environmental influences       
Polarizers       
Available polarizer options for transmission and reflection:       
Visible polarizer and analyser for transmission and reflection contrast enhancement (rotatable)       
Infrared polarizers for transmission and reflection measurements (rotatable)       
Detectors       
Software control of two detector positions is available as an option on the HYPERION series. The second detector position can be a single element or focal plane array detector for imaging. To adopt the instrument to more specific applications several broad-, mid-, and narrow band MCT detectors with 25, 50 and 100 Μm element size are available. A closed cycle cooled “CryoCooler” MCT detector with equal sensitivity but no need for liquid nitrogen is a further option. For NIR applications dedicated InSb and InGaAS detectors can be used. For FIR applications a Si-Bolometer is available. IMAC Macro Imaging Chamber Option Macro imaging with almost any traditional sampling accessory is possible with the macrochamber. The IMAC utilizes the portable FPA from the HYPERION to allow infrared chemical imaging of the sample. The video image and sample analysis area ratio is 1:1.

Looking for New or Used Equipment?

Shop on LabX

Shop on Labx.com