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TA Instruments - Modular Microscope Accessory
Manufactured by TA Instruments

TA Instruments - Modular Microscope Accessory
DESCRIPTION
The MMA enables complete flow visualization – including counter-rotation – with simultaneous rheological measurements.

The MMA enables complete flow visualization – including counter-rotation – with simultaneous rheological measurements. A high resolution camera collects images at up to 90 fps coupled with industry-standard microscope objectives that provide magnification up to 100×. Illumination from a blue-light LED can be coupled with a cross-polarizer or dichroic splitter for selective illumination or fluorescence microscopy.      The MMA mounts directly to the Discovery Hybrid Rheometer and does not require any additional stands, lifts, or other support. This makes the system simple to install and effectively isolates it from external vibration and other sources of environmental interference that would compromise image quality.      An x-y-z positioning system allows the microscope’s field of view to be placed anywhere within the sample. This allows for investigation of flow homogeneity anywhere from the axis of rotation to the sample edge. Precise depth-profiling is enabled by an optional Piezo-scanning system. This precision mechanism permits the depth of the focal plane to be adjusted in precision software-controlled increments over a 100 µm range for quantitative depth-profiling.      The MMA is compatible with the Upper Heated Plate (UHP) for temperature control from 0 °C to 100 °C.

FEATURES

• Smart SwapTM technology for quick installation   • Available counter-rotation for stagnation plan imaging on any Discovery Hybrid Rheometer   • High resolution, high frame rate image collection   • Effective temperature control through Upper Heated Plate (UHP)   • Direct sample temperature measurement with Active Temperature Control   • Visual access to any position within the measurement area, e.g. center, edge, or mid-radius   • Available cross-polarization, fluorescence, and precision depth-profiling

SPECIFICATIONS
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