Maximize Your SEM Insights    Take advantage of achieving up to 30% better SEM resolution at low voltage.    Count on the SEM performance of your ZEISS Crossbeam for 2D surface sensitive images or when performing 3D tomography. Get excellent images from any sample thanks to the Gemini optics with a resolution down to 1.4 nm at 1 kV acceleration voltage by applying a voltage to the sample with Tandem decel. Characterize your sample comprehensively with a range of detectors. Get pure materials contrast with the unique Inlens EsB detector. Investigate non-conductive specimens undisturbed by charging artifacts.   

Increase Your FIB Sample Throughput    Profit from up to 40% faster material removal by the introduction of intelligent FIB milling strategies.    Work with the highest ion beam current available in any gallium FIB-SEM. Save time with excellent FIB profiles using up to 100 nA current without compromising the ultimate FIB resolution. Profit from the speed and precision of intelligent FIB scanning strategies for material removal. Automatically prepare batches of samples, like cross-sections, TEM lamellae or any user defined pattern.   

Experience Best 3D Resolution in Your FIB-SEM Analysis    Enjoy the benefits of integrated 3D EDS analysis.    Expand the capacity of your Crossbeam with ZEISS Atlas 5, the market-leading package for fast, precise tomography. Perform EDS analysis during tomography runs with the integrated 3D Analytics module of ZEISS Atlas 5. ZEISS Crossbeam combines Gemini optics with a FIB tailored for precision and speed. Profit from best 3D resolution and leading isotropic voxel size in FIB-SEM tomography. Probe less than 3 nm in depth and produce surface sensitive, material contrast images using the Inlens EsB detector.