Bruker’s Inspire™ delivers, for the first time, highest-resolution nanoscale chemical and property mapping combined with radical productivity advances and uncompromised AFM performance. The integrated, self-optimizing system acquires nanoscale infrared absorption and reflection maps at regular AFM imaging speeds, without the limitations of indirect mechanical approaches or added complexity for the user. Taking full advantage of Bruker’s exclusive PeakForce Tapping® technology, Inspire’s new approach to infrared scattering scanning near-field optical microscopy (sSNOM) extends its capability to nanoscale chemical mapping of a wide variety of samples. The new technique, PeakForce IR™, interleaves sSNOM signal acquisition with PeakForce Tapping feedback, providing the full combined set of information at the same time.
Highest Resolution Chemical Mapping with sSNOM Spatio-spectral chemical imaging in polymers Plasmonics probing in the 2D electron gas of graphene Material type identification: metals vs semiconductors vs insulators Film thickness variation with molecular monolayer sensitivity Chemical Imaging for New Materials Powders and polymer brushes where neither contact nor TappingMode succeed Rubbery components, metals, semiconductors, ceramics, and other samples not conducive to photothermal approaches Samples not microtomable into thin slice or not mountable onto hydrophobic support Samples that don’t reflect, transmit, or are not Raman active Highest Resolution Correlated Properties Mapping Modulus, adhesion, deformation, and AFM topography images with up to atomic defect resolution Previously unattainable conductivity and workfunction mapping with high resolution even on soft and fragile samples A new level of productivity High-resolution infrared imaging with scan rates of up to 10Hz Fast optical setup of the integrated optics with point-and-click optical alignment guided by an optical field map Easier, faster, more consistent AFM imaging with Bruker’s proprietary ScanAsyst® automatic image optimization
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