JPK Instruments - NanoWizard ULTRA Speed AFM

Manufactured by  JPK Instruments
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True atomic resolution and fast scanning in the most flexible AFM system. Performance made in Germany.

The NanoWizard® ULTRA Speed AFM system sets the new standard in terms of resolution paired with scan speed. The optimized cantilever deflection detection system comes with lowest noise level of today’s AFMs. The fast electronics with highest bandwidth as well as the rigid mechanics and the newly designed high-voltage amplifiers deliver most accurate force control even on delicate sample structures.
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Features of NanoWizard ULTRA Speed AFM
  • Fast scanning >100Hz line rate in air and liquid with excellent resolution     * Atomic resolution in closed-loop mode by lowest scanner, position-sensor and detection-system noise level     * Comes with the easy-to-use QI™ mode for quantitative material property mapping     * Unique integration with optical microscopy by tip-scanning design and patented DirectOverlay™ mode for most precise correlative microscopy     * Comprehensive force measurements from single molecules to living cells     * Highest flexibility and upgradeability with a broad range of modes and accessories
General Specifications
Microscope TypeAtomic Force

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