Nanonics Imaging ltd. - MultiView 4000
Manufactured by Nanonics Imaging ltd.
No Documents
The integration of multiple probes in scanning probe microscopy (SPM) has been a dream since its earliest days of...
The integration of multiple probes in scanning probe microscopy (SPM) has been a dream since its earliest days of development. Nano-structure research using atomic force microscopy (AFM) has stimulated a desire to both investigate and manipulate samples in multiple contact scenarios. With the development of the MultiView 4000TM, Nanonics Imaging is the first manufacturer to realize the dream of SPM multiprobe imaging. The MultiView 4000 enables the utilization of up to four probes for independent imaging and manipulation of a sample. As in all Nanonics' systems, the patented, award winning 3D FlatScanTM scanner technology is used in concert with cantilevered, optically and spatially friendly probes. This allows for maximum flexibility with the ultimate resolution achievable in scanning probe microscopy.
This flexibility is highlighted by the ability to transparently combine SPM with other optical and electron/ion optical systems. This includes combination with upright, inverted or dual microscopes as well as with Raman microprobes, SEM, FIB and SEM/FIB. This allows one to combine online, chemical and other complimentary information, which is often critical in materials characterization.
This flexibility is highlighted by the ability to transparently combine SPM with other optical and electron/ion optical systems. This includes combination with upright, inverted or dual microscopes as well as with Raman microprobes, SEM, FIB and SEM/FIB. This allows one to combine online, chemical and other complimentary information, which is often critical in materials characterization.
Active Questions & AnswersAsk a Question
There are no current Discussions
Need Equipment Support?
Documents & Manuals
There are no Documents or Manuals available.
Features of MultiView 4000
- Independent scanning of up to four probes for atomic force, near-field optical and all known probes for scanned probe imaging modes
- Unique probes for multiple probe resistance measurements with two, three and four point probe geometries
- Unique thermal probes for multiple probe measurements
- Multiple probe near-field optical (NSOM, ASNOM, sSNOM) measurements
- Multiple probe nanochemical writing on a variety of structures with a variety of gaseous, liquid or solid inks with Fountain Pen NanochemistryTM
- Multiple probe nanoindentation with on-line ultra high resolution atomic force imaging of the indented structure
- Multiple probe optical or thermal desorption with tandem collection for mass spectral analysis
General Specifications
There are no General Specifications available.