Bruker AXS - Dimension® Edge™

Manufactured by  Bruker AXS
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The Dimension® Edge™ Atomic Force Microscope (AFM) System offers streamlined access to top AFM performance,...

The Dimension® Edge™ Atomic Force Microscope (AFM) System offers streamlined access to top AFM performance, representing a new level of productivity and attainability for the most advanced nanoscale research. It leverages the many innovations of the Dimension® Icon® System to provide levels of performance and functionality only available from Bruker. Designed from top to bottom to deliver the low drift and low noise necessary to achieve publication-ready data in minutes instead of hours, you won’t find a more powerful mid-priced AFM anywhere else.
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Features of Dimension® Edge™

Best Value Closed-Loop Dimension AFM     

  • Proprietary sensor design achieves closed-loop accuracy with open-loop noise levels     * Reduced noise and drift bring small-sample imaging performance to large-sample AFM     * Microscope and electronics design enable high image fidelity at moderate cost     

    Accurate, High-Resolution Results Even Faster     * Linear workflow with visual feedback ensure optimized setup in shortest time     * Camera and stage provide best sample navigation and multi-site measurements     * Seamless transitions from survey to highest resolution deliver fast, accurate results     

    Solutions for All Applications on Any Sample     * Open stage access accommodates wide variety of experiments and samples     * Optimized AFM modes and techniques meet needs of even advanced applications     * Built-in access to signal routing enables custom measurements     

    Advanced Nanoscale Capabilities For Beginners and Experts     * Innovative, modular system design provides high performance at moderate cost     * Experiment-selection modes distill decades of AFM expertise into preconfigured settings     * Integrated stage control enables intuitive navigation and powerful stage programming

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