Shimadzu - EDX-GP
Shimadzu’s EDX series
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Features of EDX-GP
Full Automation A single click in the [Screening Analysis] window automatically performs everything from measurement to the display of results, in accordance with your pre-registered analysis conditions.
Industry-leading Detection Sensitivity and Resolution Shimadzu’s proprietary semiconductor detector ensures high-sensitivity, high-resolution, and high-precision measurement of everything from light to heavy elements.
Special Filters Five types of standard filters improve detection sensitivity by reducing and eliminating scattered X-ray tube radiation that creates background components. Flexible filter conditions, such as when needing sensitive measurements of trace samples, are available to suit customer needs.
Large Sample Chamber In contrast to its compact size, the EDX-GP has a large sample chamber to accommodate as-is measurements of any sample shape or size. Users can load samples quickly and easily with a semiautomatic chamber door for high throughput with less workload.
General Specifications
There are no General Specifications available.
Additional Specifications
Measurement Principle: X-ray fluorescence Spectrometry
Measurement Method:Energy Dispersive
Measurement Sample Method: Solids, liquids or powder
Measurement Range: 13AI to 92U
X-ray Generator
X-Ray Tube: Rh target
Tube Voltage: 5 kV to 50 kV
Tube Current: 1µA to 1,000µA
Cooling Method: Air cooling (with fan)
Exposure Area: 10 mm diameter as standard
(automatic switching between 4 settings:1 mm, 3mm, 5mm and 10mm diameter)
Primary Filter: Automatic Switching between 5 types + Open
Detector
Type of Detector: Si (Li) semiconductor detector
LN2 Supply: Only during Maintenance
Dewar Capacity: 3 L
Nitrogen Consumption: Approx. 1 L/day
Counting Method: Digital filter counting
Sample Chamber
Measurement Atmosphere: Air
Sample Observation: CCD Camera