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Browse Equipment - Electron Microscopes

143 Results
Hitachi - Sample Cleaner ZONETEM

Hitachi - Sample Cleaner ZONETEM

The ZONE cleaner is a powerful and easy tool for removing hydrocarbon contamination of electron microscopy samples. ZONE...Electron Microscopes
Hitachi - Ion Milling System IM4000Plus

Hitachi - Ion Milling System IM4000Plus

The IM4000Plus Ion Milling System utilizes a broad, low-energy Ar+ ion beam milling method to produce wider, undistorted...Electron Microscopes
Hitachi - MC1000 Ion Sputter Coater

Hitachi - MC1000 Ion Sputter Coater

The MC1000 Ion Sputter Coater is a sample preparation instrument for use with a Scanning Electron Microscope (SEM). The ...Electron Microscopes
Hitachi - Ion Milling System ArBlade 5000

Hitachi - Ion Milling System ArBlade 5000

The most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat-milling samples f...Electron Microscopes
Hitachi - Micro-sampling System

Hitachi - Micro-sampling System

This device is used for preparing the desired wafer part for analysis with STEM, TEM, etc. by extracting a micro sample ...Electron Microscopes
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Hitachi - Focused Ion & Electron Beam System nanoDUE'T NB5000

Hitachi - Focused Ion & Electron Beam System nanoDUE'T NB5000

The dual-beam FIB-SEM integrates a high-performance 40 kV FIB column and an ultra-high-resolution Schottky field-emissio...Electron Microscopes
Hitachi - Real-time 3D analytical FIB-SEM NX9000

Hitachi - Real-time 3D analytical FIB-SEM NX9000

FIB-SEM System for True 3D Structural Analysis
Electron Microscopes
Hitachi - Focused Ion and Electron Beam System Ethos NX5000

Hitachi - Focused Ion and Electron Beam System Ethos NX5000

Unsurpassed Performance with Ultimate Flexibility
Electron Microscopes
Hitachi - Schottky Field Emission Scanning Electron Microscope SU5000

Hitachi - Schottky Field Emission Scanning Electron Microscope SU5000

Innovative analytical FE-SEM allows for a simple transition between high vacuum and variable pressure mode. EM Wizard is...Electron Microscopes
Hitachi - Ultra-High-Resolution Schottky Scanning Electron Microscope SU7000

Hitachi - Ultra-High-Resolution Schottky Scanning Electron Microscope SU7000

SU7000: The Next-Generation FE-SEM
Electron Microscopes
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