Home > All Categories > Microscopy

Browse Equipment - Microscopy

823 Results
Hitachi - Sample Cleaner ZONETEM

Hitachi - Sample Cleaner ZONETEM

The ZONE cleaner is a powerful and easy tool for removing hydrocarbon contamination of electron microscopy samples. ZONE...Electron Microscopes
Hitachi - Ion Milling System IM4000Plus

Hitachi - Ion Milling System IM4000Plus

The IM4000Plus Ion Milling System utilizes a broad, low-energy Ar+ ion beam milling method to produce wider, undistorted...Electron Microscopes
Hitachi - MC1000 Ion Sputter Coater

Hitachi - MC1000 Ion Sputter Coater

The MC1000 Ion Sputter Coater is a sample preparation instrument for use with a Scanning Electron Microscope (SEM). The ...Electron Microscopes
Hitachi - Ion Milling System ArBlade 5000

Hitachi - Ion Milling System ArBlade 5000

The most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat-milling samples f...Electron Microscopes
Hitachi - Scanning Probe Microscope AFM5500M

Hitachi - Scanning Probe Microscope AFM5500M

The AFM5500M is a SPM platform equipped with a fully addressable 4-inch stage, optimized for medium-sized samples. It af...AFM - Atomic Force Microscope
Advertisement
Advertisement
Hitachi - Environment Control Unit AFM5300E

Hitachi - Environment Control Unit AFM5300E

The Hitachi research-grade AFM5300E offers significantly improved sensitivity, accuracy, and resolution of electromagnet...AFM - Atomic Force Microscope
Hitachi - General-purpose Small Unit AFM5100N

Hitachi - General-purpose Small Unit AFM5100N

Hitachi's general-purpose atomic force microscope, Model AFM5100N, features superior ease of use, a wide range of capabi...AFM - Atomic Force Microscope
Hitachi - Probe Station AFM5000II / Real TuneII

Hitachi - Probe Station AFM5000II / Real TuneII

Hitachi AFM5000II includes the control system and software package to allow a wealth of advanced imaging and data analys...AFM - Atomic Force Microscope
Hitachi - Micro-sampling System

Hitachi - Micro-sampling System

This device is used for preparing the desired wafer part for analysis with STEM, TEM, etc. by extracting a micro sample ...Electron Microscopes
Hitachi - Focused Ion & Electron Beam System nanoDUE'T NB5000

Hitachi - Focused Ion & Electron Beam System nanoDUE'T NB5000

The dual-beam FIB-SEM integrates a high-performance 40 kV FIB column and an ultra-high-resolution Schottky field-emissio...Electron Microscopes
Advertisement
Advertisement
Advertisement

Ask a Question

Get answers for any lab equipment